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US Patent Issued to Tokyo Electron on July 14 for "Apparatus for processing substrate and method of transferring substrate" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,092, issued on July 14, was assigned to Tokyo Electron Ltd. (Tokyo). "Apparatus for processing substrate and method of transferring substra... Read More


US Patent Issued to Tokyo Electron on July 14 for "Method for creating product-like stressed surrogate test wafers" (New York Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,093, issued on July 14, was assigned to Tokyo Electron Ltd. (Tokyo). "Method for creating product-like stressed surrogate test wafers" was ... Read More


US Patent Issued to INGENTEC on July 14 for "Micro-LED wafer testing device and micro-LED wafer testing method" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,094, issued on July 14, was assigned to INGENTEC Corp. (Miaoli County, Taiwan). "Micro-LED wafer testing device and micro-LED wafer testing... Read More


US Patent Issued to Applied Materials on July 14 for "In-situ integrated wafer parameter detection system with remote plasma cleaning" (Singaporean, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,095, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "In-situ integrated wafer parameter detection system ... Read More


US Patent Issued to Korea Advanced Institute of Science and Technology on July 14 for "Method of manufacturing SOI wafer" (South Korean Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,096, issued on July 14, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea). "Method of manufacturing... Read More


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on July 14 for "Multi-function etching sacrificial layers to protect three-dimensional dummy fins in semiconductor devices" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,098, issued on July 14, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Multi-function etching sacrific... Read More


US Patent Issued to Applied Materials on July 14 for "Method of multi-layer die stacking with die-to-wafer bonding" (Singaporean, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,099, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Method of multi-layer die stacking with die-to-wafer... Read More


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on July 14 for "Redistribution layer metallic structure and method" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,100, issued on July 14, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Redistribution layer metallic s... Read More


US Patent Issued to NANYA TECHNOLOGY on July 14 for "Semiconductor device with a liner layer" (Taiwanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,101, issued on July 14, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan). "Semiconductor device with a liner layer" was invented... Read More


US Patent Issued to International Business Machines on July 14 for "Advanced pitch interconnects with multiple low aspect ratio segments" (New York Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,102, issued on July 14, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Advanced pitch interconnects with multiple l... Read More